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Defect-induced single-photon emission in ZnPS3

Version 1.0

Zawadzka, Natalia; Litvinov, Dmitrii; Kwast, Stan; Baranov, Denis; Rosner, Malte; Molas, Maciej; Koperski, Maciej; Grzeszczyk, Magdalena, 2025, "Defect-induced single-photon emission in ZnPS3", https://doi.org/10.58132/5RPZVG, Dane Badawcze UW, V1

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Description

We investigated single photon emitters in ZnPS3 bulk crystal. The available data include measurements of sample using photoluminescence (PL), Raman scattering (RS), atomic force microscopy (AFM), time-resolved PL, polarization-resolved PL techniques. The sample was investigated at 5 K temperature. 

The PL experiments were performed using λ = 632.8 nm excitation from the continuous-wave (CW) helium-neon laser. Measurements were carried out in a dry cryogenic system with a base temperature of 5 K. The sample was mounted onto the x-y-z piezo stages for precise positioning. The measurements were conducted in a back-scattering geometry, with laser focusing and collection carried out using a cold objective with a numerical aperture of 0.82. For the detection of the signal, the light was dispersed by a SpectraPro HRS-750 spectrometer and detected by a PyLoN 100-BRX LN2 cooled charge-coupled device (CCD) camera (both Princeton Instruments). For the photoluminescence excitation measurements, a broadband super-continuum laser coupled to the tunable bandpass filter has been used (SuperK Extreme, NKT Photonics). 

The RS experiments were performed using λ = 515 nm excitation from the CW laser diode. The studied sample was placed on a cold finger in a continuous-flow cryostat mounted on x–y motorized positioners. The measurements were conducted in a back-scattering geometry, with laser focusing and collection carried out using a 50x long-working-distance objective with a numerical aperture of 0.55. For the detection of the signal, the light was dispersed by a SpectraPro HRS-750 spectrometer and detected by a PyLoN 100-BRX LN2 cooled CCD camera (both Princeton Instruments).

Time-resolved PL measurements have been performed by using a single photon counter (Excelitas SPCM-AQRH-16-BR1) triggered by laser pulses. For excitation, a broadband super-continuum laser coupled to the tunable bandpass filter has been used (SuperK Extreme, NKT Photonics). The correlation function measurements have been conducted in the Hanbury Brown and Twiss geometry. The signal from two single photon counters has been correlated with the PicoHarp 300 module. After normalization, the recorded histograms are equivalent to the normalized second-order correlation function

Topography measurements were performed using a Bruker Dimension FastScan XR atomic force microscope operated in tapping mode with RTESPA-150 cantilevers.

(2025-12-29)
Subject
Physics
Keyword

singlephoton emitter, exciton, defect

CC BY - Creative Commons Attribution 4.0 CC BY - Creative Commons Attribution 4.0

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Fig2_b.txt
Plain Text - 155.8 KB - Dec 30, 2025 - 0 Downloads
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License: CC BY - Creative Commons Attribution 4.0
Figure 2(b). The atomic force microscopy image of the investigated flake of ZnPS3. The data is in matrix format (122 x 120). The height is in meters.
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Fig2_b_inset.txt
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MD5: bd724dc76011b1a0ae1cb762833c38e2
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Figure 2(b) inset. Its a AFM cross section. The data is composed of two columns: 1. Distance (um); 2. Height (um).
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Fig2_c.txt
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MD5: a38c97cd3ef3e748bbe9a549f3b6b5ec
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Figure 2(c). The map of normalized PL intensity centered at 1.9270 ± 0.0015 eV for the examinated ZnPS3 flake. The data is in matrix format (48 x 47). First row is Distance (um) and first column is also Distance (um).
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Fig2_d.txt
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Figure 2(d). The PL spectra of three emitters, on different positions on the sample. The data is composed of four columns: 1. Energy (eV); 2. PL of emitter E1; 3. PL of emitter E2; 4. PL of emitter E3;
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Fig2_e.txt
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Figure 2(e). The PL spectrum of emitter E1 as a function of time. The data is in matrix format (300 x 1340). First row is Time (s) and first column is Energy (eV).
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Fig2_f.txt
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Figure 2(f). Second-order correlation function measurements for emitter E1 at 1.928 eV. The data is composed of two columns: 1. Time (ns); 2. Second-order correlation function (t);
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Fig3_a.txt
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Figure 3(a). Time decay of emitter E1 measured with pulsed laser with energy 1.96 eV and power 20 μW.The data is composed of two columns: 1. Time (ns); 2. PL intensity (arbitrary units);
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Fig3_b.txt
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Figure 3(b). The normalized integrated PL intensity of emitter E1 extracted from Lorentzian fits as a function of polarization angle in excitation and detection configurations. The data is composed of fife columns: 1. Energy (eV); 2. Emission intensity (arbitrary units); 3. Error of emission intensity (arbitrary units); 4. Absorption intensity (arbitrary units); 5. Error of absorption intensity (arbitrary units);
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Fig3_c.txt
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Figure 3(c). PL and PLE measurements of emitter E4. The PL spectrum measured under 1.96 eV pulsed laser excitation at 20 μW. PLE measured under pulsed laser excitation at 20 μW. The data is composed of four columns: 1. Energy (eV); 2. Normalized PLE intensity of emitter E4; 3. Energy (eV); 4. Normalized PL intensity of emitter E4;
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Fig4_a.txt
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MD5: 263115347b4584de2723eac224aae55f
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Figure 4(a). Integrated PL intensity of emitter E5 extracted from Lorentzian fits to the spectral resonance as a function of laser excitation power. The data is composed of two columns: 1. Power (uW); 2. Integrated PL intensity (arbitrary units);
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